Fibre optic interconnecting devices and passive components - Investigation on impact of contamination and scratches on optical performance of single-mode (SM) and multimode (MM) connectors1 Scope This part of IEC 62627, which is a technical report, summarizes the extensive industry research on development of cleanliness specifications for single mode (SM) and multimode (MM) connectors. The summary of the result shows Table 1. Table 1 Summary of the result Samples Scratch Contamination Defect A RL Clause Reference SM MM Single fibre multi fibre SM PC Single fibre Scratch RL 3 [1], [5], [6] MM PC Single fibre Scratch RL 4 [7] SM PC

food containers)

amputations

Silicon carbide homoepitaxial wafer is useful in the fabrication of very high-voltage and high-power devices

storage goods which due to their nature could generate hazardous situations

The method is not applicable to water with a separate oil layer

shiny surface without any mealy appearance

and the certification of the new work

2 and 3 but not Hazard Group 4 (see note 1

or the housing of an apparatus

s signal in the frequency range 125 kHz to 140 kHz

Office sectors

and tractors and machinery for agriculture and forestry as defined in ISO 3339-0